You'll broad your career in developing and debugging Scan ATPG test patterns on ATE platforms , creating and validating test programs for NPI , analyzing test failures and yield issues , conducting silicon characterization , optimizing test efficiency , and collaborating with cross‑functional teams to support product validation and production release.
Responsibilities - Develop, debug, and bring up Scan ATPG test patterns on ATE platforms.
- Perform ATE test program development and validation during new product introduction (NPI).
- Debug scan test failures and analyze yield issues.
- Support pattern bring-up, correlation, and production release.
- Perform silicon characterization and electrical validation.
- Drive test time reduction and test optimization to improve manufacturing efficiency.
- Work closely with DFT, design, product, and vali...