Defect Inspection Recipe Optimisation for Productivity Enhancement (Internship)

This project focuses on the application of advanced inspection and measurement techniques within a semiconductor manufacturing environment. The intern will explore how inspection technologies are utilised to detect and characterise defects, and how recipe optimisation can improve manufacturing efficiency. Through this project, the intern will be exposed to the integration of innovative inspection systems and data‑driven methodologies to enhance defect detection capability. The work emphasises analytical evaluation of process performance and continuous improvement of inspection strategies.

• Develop an understanding of defect inspection methodologies in semiconductor manufacturing.
• Evaluate and optimise inspection recipes for improved process performance.
• Analyse data from inspection systems...