This internship offers the opportunity to contribute to cutting‑edge research within Micron’s TD organization. The Yield Enhancement Lab is equipped with state‑of‑the‑art Transmission Electron Microscopes (TEMs) and Focused Ion Beam (FIB) systems. The project focuses on advancing 3‑dimensional (3D) electron tomography techniques to enable nanoscale structural and compositional characterization for emerging memory technologies.

• Hands‑on experience preparing 3D NAND samples using FIB techniques.
• Execution of 3D electron tomography experiments using TEM/STEM/EFTEM.
• Exposure to tilt‑series acquisition, 3D reconstruction, and interpretation of tomographic data.
• Direct collaboration with cross‑functional engineering teams (process integration, device engineering, reliability).
• Experience documenting technical findings and presenting results in professional engineering settings.
• Insi...