The Surface Scattering and Microdiffraction (SSM) group in the X-ray Science Division (XSD) at the Advanced Photon Source (APS), Argonne National Laboratory is seeking **Two** **Postdoctoral Appointees** , both focused on multimodal synchrotron characterization of defects and interfaces in oxides and 2D materials. These positions are part of a cross-facility initiative to build an _“AlphaFold for Microelectronics”_ —a physics-informed AI framework that links composition, structure, and operating conditions to defect evolution and functional performance.

The successful candidates will lead experimental campaigns using advanced synchrotron X-ray techniques to generate quantitative, AI-ready datasets that reveal defect-mediated mechanisms governing the stability, adhesion, and transport behavior of thin films and heterointerfaces. The postdoc will lead experimental design, data acquisition, and quantitative reconstruction.

The appointees will work within a highly col...