Provide application support to achieve the Critical Dimension Scanning Electron Microscopes (CD-SEM) performance required by the customer which includes creation of measurement recipes and optimization of measurement conditions.
Analyze, interpret, and present application results to customers, providing technical recommendations.
Provide expert guidance to customers in the creation, optimization, and deployment of CD-SEM recipes at their sites.
Examine solutions for measurement challenges in cutting-edge semiconductor devices, and propose optimized conditions, additional tool adjustments, and new applications.
Investigate the root cause of any measurement issues on the CD-SEM and implement counter measures in collaboration with related departments mainly located in Japan.
Conduct applications training for customers and engineers
Requirements
Possess over 7 years of pr...
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